The correct preparation of the sample is the first fundamental step to guarantee an effective and repeatable analysis of the grain on our samples. Indeed, such value is essential to control the characteristics of our alloy and maintain an important quality of our production.
The webinar offered by QATM and ZEISS “Grain analysis: tips and techniques for a correct analysis” will show how to prepare correctly, and with what precautions, a sample for a correct analysis. Grain analysis is one of the most classic applications everybody has to deal with at the metallurgical level. QATM will address various issues related to the preparation of the sample, starting from the correct choice of mounting and polishing parameters, to the correct level of polishing, QATM will show you how to achieve a perfect analysis. The webinar will continue with an in-depth section concerning the sample preparation control in order to obtain reliable, reproducible and quality micrographic analysis.
Topics
Materialographic Preparation
- Introduction
- Mounting: correct parameters choice
- Mounting: correct consumables choice
- Traditional polishing method
- The new Polaris Sic
- Chemical etching
- Conclusions
Sample Analysis
- Introduction
- Microscope Configuration
- Preparation quality control
- Examples of analysis and reporting
- Conclusion
Presented by:
- Materialographic preparation: Davide Di Sanza, QATM Product Specialist – Verder Scientific Italy
- Sample Analysis: Silvia Contessi, David Basurto, Alessio Lombardo – Zeiss Metrologia
